• Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing
  • Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing
  • Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing
  • Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing
  • Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing
  • Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing

Pct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing

After-sales Service: 1 Year
Power Supply: AC 380V
Certification: CE, TUV, ISO
Warranty: 1 Year
Model: Hy-Pct-600
Inner Box Material: Stainless Steel #304
Customization:
Manufacturer/Factory & Trading Company

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Guangdong, China
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  • Overview
  • Product Description
  • Meet the standards
  • Features
  • Product Parameters
  • Detailed Photos
  • Company Information
Overview

Basic Info.

Model NO.
HY-PCT-600
Outer Chamber Material
Spray
Temperature Range
+100°c-132°c (Optional, up to 145)
Operating Temperature
121ºC/132ºC 121ºC/132ºC
Humidity Range
100%Rh Uncontrollable
Temperature Uniformity
±1.5°c / ±1.5°c
Transport Package
Strong Wooden Case
Specification
Customized
Trademark
HUANYI
Origin
China
HS Code
9013809000
Production Capacity
10000pieces/Year

Product Description

Product Description

PCT Test Chamber / Accelerated Pressure Aging Tester

Saturated Unsaturated Humidity Pressure Aging Test Chamber is suitable for the sealing performance of defense, aerospace, automotive parts, electronic parts, plastics, magnet industries, pharmaceuticals, circuit boards, multilayer circuit boards, IC, LCD, magnets, lighting, lighting products and other products Testing, related products for accelerated life test, used in the product design stage, used to quickly expose product defects and weaknesses. Test the wear resistance and air tightness of its products.


PCT aging chamber is used to test capability of semiconductors. The product to be tested is placed in a specific temperature, humidity and pressure environment to test the pressure resistance and air tightness of the sample. It increases environmental stress (temperature, humidity and pressure) and working stress (product voltage, load, etc.) to speed up the test process and shorten the life test time of the product or system.
 

Meet the standards

GB/T2423.40-2013
IEC60068-2-66:1994

Features


1. HY-PCT-600 PCT test chamber adopts SSR non-contact heating control. 

2. water level protection, by detecting the water level in the oven.

3. safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button.
 

Product Parameters

 
Item/Model HY-PCT-250 HY-PCT-350 HY-PCT-450 HY-PCT-650
Inner Size(mm)(W x H x D) 250*300 350*400 450*500 650*600
Outer Size(mm)(W x H x D) 500*450*650 600*550*750 700*650*850 700*650*850
Material(Inner)
Stainless steel #304
Material(Outer) Powder
Temperature Range +100ºC-132ºC(Optional: up to 145ºC)
Structure Standardized pressure vessels
Humidification System
Electric heating tube
Humidification Water Supply Manual filling(automatic filling)
Pressure Range 0-2kg/mm²(Optional: up to 3kg/mm²)
Power Supply  220V-240V  50/60HZ Single Phase
Operating Temperature 121ºC/132ºC
Temperature Uniformity  ±1.5ºC
Operating Maximum Pressure 2.0Kg/mm², 
Can withstand high oxygen pressure of more than 6ATM
Temperature Controller Adopt PID microcomputer temperature controller
 

Detailed Photos

Pct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing

Company Information

Pct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability TestingPct Accelerated Aging Test Chamber for Semi Conductor Reliability Testing

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Diamond Member Since 2023

Suppliers with verified business licenses

Manufacturer/Factory & Trading Company
Number of Employees
41
Year of Establishment
2007-03-20