2-Box Type Thermal Shock Test Chamber Instrument /High and Low Temperature Environmental Test Chamber

• After-sales Service: Remote Operation, Video Calls, House Calls
• Warranty: 1 Year
• Application: Industry, School, Hospital, Lab
• Customized: Customized
• Certification: CE, ISO
• Structure: Console Mode
• Model NO.: HYTW-275C
• Material: Stainless Steel
• Brand: Huanyi
• High Room Temperature Range: R.T(High Room Temperature) ~ +200ºC ≤60min
• Temperature Rise Time: R.T~ -50ºC
• Low Temperature Room Temperature Range: R.T(High Room Temperature) ~ +200ºC ≤60min
• Temperature Drop Time: ±0.5ºC
• Temperature Shock Range: -40ºC~+150ºC
• Temperature Fluctuation: ≤±0.5ºC (No Load, Constant State)
• Temperature Uniformity: ≤2ºC (No Load, Constant State)
• Temperature Departure: ≤±2ºC (No Load, Constant State)
• Transfer Time: ≤10s
• Transport Package: Wooden Packing
• Specification: 500*500*400mm
• Trademark: HUANYI
• Origin: China
• HS Code: 8514199000
• Production Capacity: 100/Month

Product Description

Product Description

The Type Thermal Shock Test Chamber (two compartment temperature impact test chamber)  can simulate the instantaneous changing environment between high and low temperatures,

used to determine whether equipment undergoes physical damage or performance degradation when subjected to rapid changes in ambient atmospheric temperature.
 

It is an essential testing equipment in the fields of aviation, automotive, home appliances, scientific research, and other fields.

It assesses and determines the parameters and performance of testing instruments, mechanical, electrical, electronic products, and components after high and low temperature impact tests.

Two chamber method high and low temperature impact test chamber, equipped with two studios, namely high temperature zone and low temperature zone.
The test piece is moved to the corresponding studio through a hanging basket for high and low temperature impact testin

 

Standard

The Two-box Type Thermal Shock Test Chamber meets the test standards

GB/T2423.1-2001 Test A: Low temperature test method

GB/T2423.2-2001 Test B: High temperature test method

GJB150.3A-2009 High temperature test

GJB150.4A-2009 Low temperature test

GJB150.5A-2009 Temperature shock test

 

Product Parameters

Thermal shock test chamber specifications

Auxiliary function

Fault alarm and cause

Power-off protection function

Calendar timing function (automatic start and stop)

Self-diagnostic function

Detailed Photos

Company Information