HAST Chamber
Unsaturated "HAST" & Saturated "PCT" Chambers
HAST-Highly Accelerated Stress Test Chambers
HAST (Highly Accelerated Stress Test) chambers reduce the time it takes to complete humidity testing for semiconductors. By elevating temperatures above 100°C and increasing the pressure, simulation of normal humidity tests can be made while maintaining the same failure mechanisms. Tests can be completed in days, or weeks. Our HAST systems have a modern design that's easier to use:
1,Automatic humidity filling
2,Automatic door lock
3,A round workspace,allowing wider sample boards to be loaded
4,Convenient,hermetic power-pin system for bias testing
We now offer and "Air HAST" modification for faster testing of lead-free solder whisker resistance to humidity.
HAST stands for Highly Accelerated Stress Testing. The HAST test chamber is a special test chamber used in the fields of material testing and reliability engineering. It is designed to simulate harsh and accelerated environmental conditions to evaluate the reliability and durability of products and materials, particularly electronic components and assemblies. Major applications for HAST chambers include:
Moisture Resistance Testing: HAST chambers are used to evaluate the moisture resistance of materials and components. They created an accelerated aging environment by subjecting the samples to high temperatures, humidity and pressure. This helps manufacturers identify potential weaknesses and assess the reliability of their products in wet conditions.
Failure Analysis: The HAST chamber is used for failure analysis investigations. When a product or material fails in use due to moisture-related issues, HAST testing can be used to replicate and understand the failure mechanism. By subjecting failed samples to accelerated humidity conditions, engineers can observe and analyze failure modes, helping to identify root causes and develop appropriate solutions.
Reliability Testing: HAST chambers are used to evaluate the long-term reliability of products and materials under accelerated conditions. By exposing them to heat, moisture and pressure, manufacturers can quickly assess the likelihood of failure and assess the expected life of their products. This helps improve designs and improve product quality.
Packaging Testing: HAST chambers are used in the packaging industry to evaluate the integrity and reliability of sealed packages and containers. They simulate the effects of humidity and pressure on packaging materials, helping manufacturers evaluate a package's ability to resist moisture intrusion and protect contents during storage, transportation or use.
Electronic Testing: HAST chambers are commonly used in the electronics industry to evaluate the reliability of electronic components and assemblies. They can simulate harsh conditions that electronic equipment may encounter, such as high humidity and temperature. By subjecting components to accelerated stress, manufacturers can identify potential failure modes and improve the designs and materials used in their electronic products.
HAST high pressure accelerated aging test chamber product features:
1. It adopts imported high-temperature resistant solenoid valve dual-circuit structure, which reduces the failure rate to the greatest extent.
2. Independent steam generation chamber to prevent steam from directly impacting the product to avoid causing local damage to the product.
3. The labor-saving structure of the door lock solves the problem of difficulty in locking the disc-type handle of the first-generation product.
4. The cooling air is discharged before the test, and the cooling air discharge design during the test (the air in the test barrel is discharged) improves pressure stability and reproducibility.
5. Ultra-long experimental operation time, the long-term experimental machine can operate for 400 hours.
6. Water level protection, detected and protected through the water level sensor in the test room.
7. Tank pressure-resistant design, the tank can withstand pressure (150ºC) 2.65kg, and meets the water pressure test 6kg.
8. Two-stage pressure safety protection device, which adopts a two-stage combination of controller and mechanical pressure protection device.
9. Safety protection pressure relief button, emergency safety device two-stage automatic pressure relief button.
10. The withstand voltage of the bias test terminal can reach 3000V (optional)
11.USB exports historical data and curves.
HAST high pressure accelerated aging test chamber execution test standards:
GB/T2423.40-1997 Environmental testing of electrical and electronic products Part 2: Test method Cx: Constant moist heat of unsaturated high-pressure steam
IEC60068-2-66-1994 Environmental testing. Part 2-66: Test methods. Test Cx: Steady-state damp heat
JESD22-A100 Cycling Temperature and Humidity Excursion Lifetime
JESD22-A101 Steady-state temperature, humidity/bias, life test (temperature and humidity bias life)
JESD22-A102 High Pressure Cooking Test (Accelerated Moisture Penetration Resistance)
JESD22-A108 Temperature, Bias Voltage and Operating Life
JESD22-A110 HAST Highly Accelerated Temperature and Humidity Stress Test
JESD22-A118 Temperature and humidity unbiased highly accelerated stress test UHAST (unbiased voltage unsaturated high-pressure steam)
| Item/Model |
HY-PCT-250 |
HY-PCT-350 |
HY-PCT-450 |
HY-PCT-650 |
| Inner Size(mm)(W x H x D) |
250*300 |
350*400 |
450*500 |
650*600 |
| Outer Size(mm)(W x H x D) |
500*450*650 |
600*550*750 |
700*650*850 |
700*650*850 |
| Material(Inner) |
Stainless steel #304
|
| Material(Outer) |
Powder |
| Temperature Range |
+100ºC-132ºC(Optional: up to 145ºC) |
| Structure |
Standardized pressure vessels |
|
Humidification System
|
Electric heating tube |
| Humidification Water Supply |
Manual filling(automatic filling) |
| Pressure Range |
0-2kg/mm²(Optional: up to 3kg/mm²) |
| Power Supply |
220V-240V 50/60HZ Single Phase |
| Operating Temperature |
121ºC/132ºC |
| Temperature Uniformity |
±1.5ºC |
| Operating Maximum Pressure |
2.0Kg/mm²,
Can withstand high oxygen pressure of more than 6ATM |
| Temperature Controller |
Adopt PID microcomputer temperature controller |
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